TTE Systems announces next course in "Design Patterns for Reliable Embedded Systems" in Penang

Our next 5-day public training course covers “Design patterns for reliable embedded systems”.

We still have a few places are available on this module, which takes place from 10-14 October 09 in PSDC (Penang, Malaysia).

Please note:

  • You can attend this 5-day course for just RM3500 (Malaysia).
  • During 10 detailed seminars, you will learn how to use existing design patterns - and create your own patterns - in order make your embedded systems more reliable.
  • It’s not all theory! In addition to the seminars, the module also includes a series of laboratory classes where you can develop and test your skills. To support work in the labs, you will receive a full permanent licence for RapidiTTy™ MCU as part of your registration fee for the module.
  • After the course, you will have up to two months to register for the complete MSc programme in Reliable Embedded Systems (if you wish to do so): if you sign up for the MSc, we’ll refund the cost of your short course (conditions apply).

A short course brochure is available (you’ll also find a detailed brochure for the whole MSc programme on our Downloads page).

Please note:

  • Your company can attend only one course at this introductory rate (normal course fee is RM10500).
  • We regret that we cannot provide group discounts (or any other form of discount) on these prices.
  • You cannot combine these introductory rates with any other offer.
  • All fees must be paid in full before the module commences.

Comments from previous participants on our courses

“I think this module is great as the materials can be directly applied to the workplace.”

“The practical part of the course / module is very appropriate … especially for non-software engineers like myself.”

“I find that the lecturer is knowledgeable and helpful.”

Read review in Micro Technology Europe (Dec 08)

The MSc in Reliable Embedded Systems was reviewed in a recent article in Micro Technology Europe (Dec 08). Please click here to download a copy of this article.